METHOD FOR POST-MORTEM PATHOMORPHOLOGIC EXAMINATION OF BRAIN IN CASES OF ENCEPHALOPATHY

摘要

The invention relates to medicine, namely to pathomorphology, and it is associated with post-mortem pathomorphologic brain examination in cases of encephalopathy. The aim of the invention is to develop brain tissue post-mortem detection techniques for pathomorphologic brain examination in cases of encephalopathy, which would allow eliminating discrepancies and errors in post-mortem diagnosis of the disease. The goal is achieved by ensuring that during the pathomorphologic examination of post-mortem brain, it is removed from the skull, and the examination determines skull vault's largest span along the mid-line of the skull's inner surface CD, determines skull vault's largest span along the mid-line of the skull's outer surface GH, cuts a straight front-parietal line (starting from the frontal lobe) of the underside of the two hemispheres, exposing the brain's lateral and third ventricle, then placing it in the preparation bath, fixating both sides of the hemispheres and determining the outer distance between the brain's frontal horns AB, the distance along the midline EF of the lateral ventricle, and the ratio of the coefficient, thus determining post-mortem signs of encephalopathy.