发明名称 |
TRANSISTOR, METHOD FOR FABRICATING THE SAME AND ELECTRONIC DEVICE INCLUDING THE SAME |
摘要 |
The present technology is to provide a transistor capable of increasing a driving current. A CMOSFET according to the present technology includes an NMOSFET which includes a tensile strained-gate electrode including a first lattice-mismatched silicon layer and a tensile stressed-channel due to a tensile strain and a PMOSFET which includes a compressive strained-gate electrode including a second lattice mismatched silicon layer and a compressive stressed-channel due to compressive strain. |
申请公布号 |
KR20150054219(A) |
申请公布日期 |
2015.05.20 |
申请号 |
KR20130136392 |
申请日期 |
2013.11.11 |
申请人 |
SK HYNIX INC. |
发明人 |
JI, YUN HYUCK |
分类号 |
H01L27/092;H01L21/336;H01L27/105;H01L29/78 |
主分类号 |
H01L27/092 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|