发明名称 Nanometer-scale level structures and fabrication method for digital etching of nanometer-scale level structures
摘要 A ramped etalon cavity structure and a method of fabricating same. A bi-layer stack is deposited on a substrate. The bi-layer stack includes a plurality of bi-layers. Each bi-layer of the plurality of bi-layers includes an etch stop layer and a bulk layer. A three dimensional photoresist structure is formed by using gray-tone lithography. The three dimensional photoresist is plasma etched into the bi-layer stack, thereby generating an etched bi-layer stack. The etched bi-layer stack is chemically etched with a first chemical etchant to generate a multiple-step structure on the substrate, wherein the first chemical etchant stops at the etch stop layer.
申请公布号 US9035408(B2) 申请公布日期 2015.05.19
申请号 US201414269292 申请日期 2014.05.05
申请人 The United States of America, as represented by the Secretary of the Navy 发明人 Boudreau Andrew J.;Yetzbacher Michael K.;Christophersen Marc;Phlips Bernard F.
分类号 H01L27/146 主分类号 H01L27/146
代理机构 US Naval Research Laboratory 代理人 US Naval Research Laboratory ;Koshy Suresh
主权项 1. A method of fabricating a multiple-step structure on a substrate, the method comprising: depositing a bi-layer stack on a substrate, the bi-layer stack comprising a plurality of bi-layers, each bi-layer of the plurality of bi-layers comprising an etch stop layer and a bulk layer; forming a three dimensional photoresist structure by using gray-tone lithography; plasma etching the three dimensional photoresist into the bi-layer stack, thereby generating an etched bi-layer stack; and chemically etching the etched hi-layer stack with a first chemical etchant to generate a multiple-step structure on the substrate, wherein the first chemical etchant stops at the etch stop layer.
地址 Washington DC US
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