发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a trench semiconductor device in which decrease in withstanding voltage is inhibited and provide a manufacturing method of the semiconductor device.SOLUTION: A semiconductor device comprises: a first conductivity type first semiconductor region; a second conductivity type second semiconductor region arranged on the first semiconductor region; an insulation film arranged on a bottom and an inner wall of a trench which extends from a top face of the second semiconductor region and pierces the second semiconductor region to reach the first semiconductor region; a control electrode which is arranged inside the trench and opposite to the second semiconductor region across the insulation film and inclines in a manner such that a top face becomes lower from a part contacting a side face of the trench toward a central part of the trench; a first conductivity type third semiconductor region which has a portion opposite to an upper part of the control electrode via the insulation film and is arranged on a top face of the second semiconductor region and around lateral faces of the trench: an interlayer insulation film arranged on the control electrode; and a main electrode arranged on the interlayer insulation film.</p> |
申请公布号 |
JP2015095466(A) |
申请公布日期 |
2015.05.18 |
申请号 |
JP20130231925 |
申请日期 |
2013.11.08 |
申请人 |
SANKEN ELECTRIC CO LTD |
发明人 |
MATSUDA SHIGENOBU |
分类号 |
H01L29/78;H01L21/28;H01L21/336;H01L29/41;H01L29/417;H01L29/739 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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