发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device capable of simultaneously cancelling a plurality of aberrations generated by non-constant distribution of energy and opening angles of the charged particle beam device.SOLUTION: A charged particle beam device includes: an aberration generation lens for generating aberration by passing charged particle beams through the outside of an axis; and a correction lens for converging the orbit on the principal surface of an objective lens without depending on energy of the charged particle beams. The principal surface of the correction lens is arranged in a crossover position where a plurality of charged particle beams having angles different from each other are converged after passing through the aberration generation lens.
申请公布号 JP2015095297(A) 申请公布日期 2015.05.18
申请号 JP20130232668 申请日期 2013.11.11
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 IKEGAMI AKIRA;DOI HIDETO;KAZUMI HIDEYUKI;OSE YOICHI;SUZUKI NAOMASA;MARUYAMA MOMOYO
分类号 H01J37/153;H01J37/147;H01J37/28 主分类号 H01J37/153
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