发明名称 VISUAL INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a technique for reducing the influence of irregularities due to an original shape of an object to be inspected or deflection generated in the object, in visual inspection by means of image processing to be performed on a pseudo-image using an optical cutting method.SOLUTION: A visual inspection device includes: a base luminance value acquisition unit which acquires a representative value of luminance values of a plurality of spots in an area along the other direction of pseudo-image data including points in a surface to be inspected, as a base luminance value corresponding to a base height in each of the points; and a corrected pseudo-image data acquisition unit which acquires corrected pseudo-image data by subtracting the base luminance value of the points from the luminance value of the points of the pseudo-image data.</p>
申请公布号 JP2015094707(A) 申请公布日期 2015.05.18
申请号 JP20130235166 申请日期 2013.11.13
申请人 RICOH ELEMEX CORP;YOKOHAMA RUBBER CO LTD:THE 发明人 NAKAGAWA KEIJI;MATSUO HIROSHI
分类号 G01B11/24;G01N21/88 主分类号 G01B11/24
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