发明名称 |
CHAMBER CLEANING WHEN USING ACID CHEMISTRIES TO FABRICATE MICROELECTRONIC DEVICES AND PRECURSORS THEREOF |
摘要 |
The present invention provides treatment strategies that reduce contamination on wafer surfaces that are treated with acid chemistries. The strategies are suitable for use with a wide variety of wafers, including those including sensitive microelectronic features or precursors thereof. These strategies involve a combination of neutralizing and rinsing strategies that quickly and effectively remove residual acid and acid by-products from both the front side of workpiece(s) as well as from other processing chamber surfaces that can be causes of contamination. |
申请公布号 |
US2015128993(A1) |
申请公布日期 |
2015.05.14 |
申请号 |
US201414539160 |
申请日期 |
2014.11.12 |
申请人 |
TEF FSI, Inc. |
发明人 |
Berg Erik R.;Siefering Kevin L. |
分类号 |
B08B3/08 |
主分类号 |
B08B3/08 |
代理机构 |
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代理人 |
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主权项 |
1. A method of cleaning a chamber; comprising the steps of:
(a) positioning a microelectronic device precursor in a treatment chamber comprising an interior chamber surface that overlies the precursor; (b) treating the workpiece with an a, acidic composition under conditions such that an acid residue collects on at least a portion of the interior chamber surface overlying the workpiece; (c) causing a neutralizing composition comprising at least one base to contact acid residue on the interior chamber surface; and (d) after the neutralizing composition contacts the acid residue, rinsing the interior chamber surface. |
地址 |
Chaska MN US |