发明名称 CHAMBER CLEANING WHEN USING ACID CHEMISTRIES TO FABRICATE MICROELECTRONIC DEVICES AND PRECURSORS THEREOF
摘要 The present invention provides treatment strategies that reduce contamination on wafer surfaces that are treated with acid chemistries. The strategies are suitable for use with a wide variety of wafers, including those including sensitive microelectronic features or precursors thereof. These strategies involve a combination of neutralizing and rinsing strategies that quickly and effectively remove residual acid and acid by-products from both the front side of workpiece(s) as well as from other processing chamber surfaces that can be causes of contamination.
申请公布号 US2015128993(A1) 申请公布日期 2015.05.14
申请号 US201414539160 申请日期 2014.11.12
申请人 TEF FSI, Inc. 发明人 Berg Erik R.;Siefering Kevin L.
分类号 B08B3/08 主分类号 B08B3/08
代理机构 代理人
主权项 1. A method of cleaning a chamber; comprising the steps of: (a) positioning a microelectronic device precursor in a treatment chamber comprising an interior chamber surface that overlies the precursor; (b) treating the workpiece with an a, acidic composition under conditions such that an acid residue collects on at least a portion of the interior chamber surface overlying the workpiece; (c) causing a neutralizing composition comprising at least one base to contact acid residue on the interior chamber surface; and (d) after the neutralizing composition contacts the acid residue, rinsing the interior chamber surface.
地址 Chaska MN US