发明名称 |
SUBSTRATE LIQUID PROCESSING APPARATUS AND SUBSTRATE LIQUID PROCESSING METHOD |
摘要 |
A substrate liquid processing apparatus includes a tank; a circulation line; a processing unit connected to the circulation line through a branch line and configured to perform a liquid processing on a substrate using a processing liquid flowing through the circulation line; a processing liquid producing mechanism configured to produce the processing liquid by mixing at least two kinds of raw material liquids supplied from respective raw material liquid sources at a controlled mixing ratio; a concentration measuring device configured to measure a concentration of the processing liquid flowing through the circulation line and a concentration of the processing liquid flowing through the processing liquid supply line; and a control device configured to control the processing liquid producing mechanism based on the measured concentrations of the processing liquid. |
申请公布号 |
US2015131403(A1) |
申请公布日期 |
2015.05.14 |
申请号 |
US201414536989 |
申请日期 |
2014.11.10 |
申请人 |
Tokyo Electron Limited |
发明人 |
Takaki Yasuhiro;Komiya Hiroshi;Nobukuni Chikara;Satake Keigo;Anamoto Atsushi |
分类号 |
B01F15/00;B01F3/08 |
主分类号 |
B01F15/00 |
代理机构 |
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代理人 |
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主权项 |
1. A substrate liquid processing apparatus comprising:
a tank configured to store a processing liquid obtained by mixing at least two kinds of raw material liquids; a circulation line configured to allow the processing liquid to flow out from the tank and flow back to the tank; a liquid processing unit configured to perform a liquid processing on a substrate using the processing liquid in the tank; a processing liquid producing mechanism configured to produce the processing liquid by mixing the at least two kinds of raw material liquids supplied from respective raw material liquid sources; a processing liquid supply line configured to supply the processing liquid produced by the processing liquid producing mechanism to the tank; a concentration measuring device configured to measure a concentration of the processing liquid flowing through the circulation line and a concentration of the processing liquid flowing through the processing liquid supply line; and a control device configured to control the processing liquid producing mechanism such that the concentration of the processing liquid falls within a predetermined concentration range, based on the concentrations of the processing liquid measured by the concentration measuring device. |
地址 |
Tokyo JP |