发明名称 TEMPERATURE CHARACTERISTIC CORRECTION DEVICE, TEMPERATURE CHARACTERISTIC CORRECTION FORMULA DETERMINATION METHOD, ELECTRONIC APPARATUS, AND CONTROL CIRCUIT
摘要 A temperature characteristic correction device corrects a temperature characteristic of an electronic device. The temperature characteristic correction device calculates a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula. The temperature characteristic correction device calculates a total correction amount from the peak correction characteristic and the correction characteristic, and then corrects the temperature characteristic using the total correction amount.
申请公布号 US2015131695(A1) 申请公布日期 2015.05.14
申请号 US201414539189 申请日期 2014.11.12
申请人 Seiko Epson Corporation 发明人 KOBAYASHI Yoshihiro
分类号 G01K15/00 主分类号 G01K15/00
代理机构 代理人
主权项 1. A temperature characteristic correction device adapted to correct a temperature characteristic of an electronic device, the temperature characteristic correction device calculating a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula;calculating a total correction amount from the peak correction characteristic and the correction characteristic; andcorrecting the temperature characteristic using the total correction amount.
地址 Tokyo JP