发明名称 |
TEMPERATURE CHARACTERISTIC CORRECTION DEVICE, TEMPERATURE CHARACTERISTIC CORRECTION FORMULA DETERMINATION METHOD, ELECTRONIC APPARATUS, AND CONTROL CIRCUIT |
摘要 |
A temperature characteristic correction device corrects a temperature characteristic of an electronic device. The temperature characteristic correction device calculates a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula. The temperature characteristic correction device calculates a total correction amount from the peak correction characteristic and the correction characteristic, and then corrects the temperature characteristic using the total correction amount. |
申请公布号 |
US2015131695(A1) |
申请公布日期 |
2015.05.14 |
申请号 |
US201414539189 |
申请日期 |
2014.11.12 |
申请人 |
Seiko Epson Corporation |
发明人 |
KOBAYASHI Yoshihiro |
分类号 |
G01K15/00 |
主分类号 |
G01K15/00 |
代理机构 |
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代理人 |
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主权项 |
1. A temperature characteristic correction device adapted to correct a temperature characteristic of an electronic device,
the temperature characteristic correction device
calculating a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula;calculating a total correction amount from the peak correction characteristic and the correction characteristic; andcorrecting the temperature characteristic using the total correction amount. |
地址 |
Tokyo JP |