发明名称 DUAL SPECTROMETER
摘要 Systems and techniques for optical spectrometer detection using, for example, IR spectroscopy components and Raman spectroscopy components are described. For instance, a system includes a first electromagnetic radiation source configured to illuminate a sample with a first portion of electromagnetic radiation in a first region of the electromagnetic spectrum (e.g., an IR source) and a second electromagnetic radiation source configured to illuminate a sample with a second portion of electromagnetic radiation in a second substantially monochromatic region of the electromagnetic spectrum (e.g., a laser source). The system also includes a detector module configured to detect a sample constituent of a sample by analyzing a characteristic of electromagnetic radiation reflected from the sample associated with the first electromagnetic radiation source and a characteristic of electromagnetic radiation reflected from the sample associated with the second electromagnetic radiation source.
申请公布号 EP2870441(A1) 申请公布日期 2015.05.13
申请号 EP20130813794 申请日期 2013.07.03
申请人 SMITHS DETECTION INC. 发明人 SCHIERING, DAVID, W.;FRAYER, MAXIM;ZOU, PENG
分类号 G01J3/02;G01J3/10;G01J3/36;G01J3/42;G01J3/44 主分类号 G01J3/02
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