| 摘要 |
The present invention relates to a semiconductor system, wherein the semiconductor system comprises: a first semiconductor device including a first pad, a second pad, and a first test input pad, storing data inputted serially through the first test input pad, and outputting the stored data in parallel through the first pad and the second pad; a second semiconductor device including a third pad, a fourth pad, and a second test output pad, and storing the data inputted in parallel through the second pad and the fourth pad; a first through via connecting the first pad to the third pad; and a second through via connecting the second pad to the fourth pad. |
