发明名称 Frequency enhanced impedance dependent power control for multi-frequency RF pulsing
摘要 Methods for processing a substrate in a plasma processing, chamber employing a plurality of RF power supplies. The method includes pulsing at a first pulsing frequency a first RF power supply to deliver a first RF signal between a high power state and a low power state. The method further includes switching the RF frequency of a second RF signal output by a second RF power supply between a first predefined RF frequency and a second RF frequency responsive to values of a measurable chamber parameter. The first RF frequency and the second RF frequencies and the thresholds for switching were learned in advance during a learning phase while the first RF signal pulses between the high power state and low power state at a second RF frequency lower than the first RF frequency and while the second RF power supply operates in different modes.
申请公布号 US9030101(B2) 申请公布日期 2015.05.12
申请号 US201213621759 申请日期 2012.09.17
申请人 Lam Research Corporation 发明人 Valcore, Jr. John C.;Lyndaker Bradford J.
分类号 H01J37/32 主分类号 H01J37/32
代理机构 Martine Penilla Group, LLP 代理人 Martine Penilla Group, LLP
主权项 1. A method for processing a substrate in a plasma processing system having at least one plasma processing chamber, said plasma processing chamber employing a plurality of RF power supplies for sustaining a plasma within said plasma processing chamber during said processing, comprising: pulsing a first RF power supply of said plurality of RF power supplies to deliver a first RF signal between a high power state and a low power state, wherein said pulsing is performed at a first pulsing frequency; and operating a second RF power supply of said plurality of RF power supplies in a fixed frequency mode wherein said second RF power supply is not permitted to self-tune a frequency of a second RF signal output by said second RF power supply and wherein said second RF signal operates with at least two fixed alternate RF frequency values: a first RF frequency value and a second RF frequency value, wherein said first RF frequency value and said second RF frequency value are learned earlier during a learning phase when said second RF power supply operates in a frequency self-tuning mode to self-tune an RF frequency of said second RF signal in response to said first RF signal pulsing between said high power state and said low power state at a second pulsing frequency lower than said first pulsing frequency.
地址 Fremont CA US