摘要 |
Exemplary embodiments of the present invention relate to an internal jitter tolerance tester. The internal jitter tolerance tester may include a digital loop filter consisting of a cyclic accumulator which accumulates a phase detector′s output, a gain multiplier, an internal accumulated jitter generator (or an internal sinusoid jitter generator), and a phase rotator (or DCO) controller. The internal accumulated jitter generator may include a PRBS generator, a digital loop filter, an accumulator, and a gain controller. The accumulated jitter generator also may be replaced with the internal sinusoid jitter generator. The internal sinusoid jitter generator may include a counter, a sinusoid jitter profile lookup table, and a gain controller. |
申请人 |
TERASQUARE CO., LTD.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
BAE, HYEON MIN;LEE, JOON YEONG;PARK, JIN HO;KIM, TAE HO |