发明名称 Variable resistance memory device and operating method thereof
摘要 An operating method of a variable resistance memory device including a pre-read step which may include the steps of: reading a first reference cell using a first reference voltage; reading a second reference cell using a second reference voltage; and setting a third reference voltage based on the first and second reference voltages; and a main read step of reading a selected memory cell using the third reference voltage.
申请公布号 US9030861(B2) 申请公布日期 2015.05.12
申请号 US201213720911 申请日期 2012.12.19
申请人 SK Hynix Inc. 发明人 Yon Sun Hyuck
分类号 G11C13/00;G11C7/16 主分类号 G11C13/00
代理机构 William Park & Associates Ltd. 代理人 William Park & Associates Ltd.
主权项 1. An operating method of a variable resistance memory device, comprising: a pre-read step comprising the steps of: reading a first reference cell by comparing a voltage generated according to data stored in the first reference cell with a first reference voltage; reading a second reference cell by comparing a voltage generated according to data stored in the second reference cell with a second reference voltage; and setting a value between the first and second reference voltages as a third reference voltage; and a main read step of reading a selected memory cell by comparing a voltage generated according to data stored in the selected memory cell with the third reference voltage.
地址 Gyeonggi-do KR