发明名称 |
Variable resistance memory device and operating method thereof |
摘要 |
An operating method of a variable resistance memory device including a pre-read step which may include the steps of: reading a first reference cell using a first reference voltage; reading a second reference cell using a second reference voltage; and setting a third reference voltage based on the first and second reference voltages; and a main read step of reading a selected memory cell using the third reference voltage. |
申请公布号 |
US9030861(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201213720911 |
申请日期 |
2012.12.19 |
申请人 |
SK Hynix Inc. |
发明人 |
Yon Sun Hyuck |
分类号 |
G11C13/00;G11C7/16 |
主分类号 |
G11C13/00 |
代理机构 |
William Park & Associates Ltd. |
代理人 |
William Park & Associates Ltd. |
主权项 |
1. An operating method of a variable resistance memory device, comprising:
a pre-read step comprising the steps of: reading a first reference cell by comparing a voltage generated according to data stored in the first reference cell with a first reference voltage; reading a second reference cell by comparing a voltage generated according to data stored in the second reference cell with a second reference voltage; and setting a value between the first and second reference voltages as a third reference voltage; and a main read step of reading a selected memory cell by comparing a voltage generated according to data stored in the selected memory cell with the third reference voltage. |
地址 |
Gyeonggi-do KR |