发明名称 PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a probe card including a transformer arranged between a probe head and a circuit board of the probe card to indirectly connect the probe head to the circuit board.SOLUTION: A probe card includes a circuit board 110, a transformer 120, a probe head 130, and a reinforcement structure 140. The transformer includes a main body part 122, a plurality of first solder balls 124, and a plurality of first contacts 126, and is arranged adjacent to the circuit board. The main body part includes a first surface 122a facing the circuit board and a second surface 122b on the opposite side thereof. The plurality of first solder balls are arranged on the first surface, and the plurality of first contacts are arranged on the second surface. The probe head is arranged adjacent to the second surface, and electrically connected to the circuit board via the plurality of first solder balls. The reinforcement structure is arranged between the probe head and the circuit board.
申请公布号 JP2015090363(A) 申请公布日期 2015.05.11
申请号 JP20140023910 申请日期 2014.02.11
申请人 VIA TECHNOLOGIES INC 发明人 KUNG CHEN-YUEH;CHANG WEN-YUAN;CHEN WEI-CHENG
分类号 G01R1/073;G01R31/26;H01L21/66 主分类号 G01R1/073
代理机构 代理人
主权项
地址