发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device capable of more stable operation.SOLUTION: A silicon carbide semiconductor device 1 comprises: a silicon carbide layer 11 which has a principal surface 11A and a principal surface 11B and includes a drift region 12 composing a part of the principal surface 11A and the principal surface 11B and a body region 13 contacting the drift region 12; a source electrode 40 and a Schottky electrode 80 which are arranged in contact with the principal surface 11A; and a drain electrode 70 arranged on the principal surface 11B side. In the silicon carbide semiconductor device 1, a MOSFET 1A and an SBD 1B are formed. Temperature dependency of on-resistance in the MOSFET 1A denotes the same tendency of temperature dependency of on-resistance in the SBD 1B.</p> |
申请公布号 |
JP2015090883(A) |
申请公布日期 |
2015.05.11 |
申请号 |
JP20130229254 |
申请日期 |
2013.11.05 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
WADA KEIJI;MASUDA TAKEYOSHI;HIYOSHI TORU |
分类号 |
H01L29/78;H01L21/28;H01L21/3065;H01L21/336;H01L27/04;H01L29/12;H01L29/47;H01L29/872 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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