| 摘要 |
<p>A circuit test method and system, which are used for testing a circuit of a transmission-type capacitive touchscreen. The method comprises: when a certain induction line in a first electrode matrix or a second electrode matrix is tested, configuring all the other induction lines in the first electrode matrix and the second electrode matrix except the induction line to be tested as earth lines, transporting a first voltage to the induction line to be tested, detecting a current on the induction line to be tested, and when a current is generated on the induction line to be tested, and determining that the induction line to be tested is in a short-circuit state; and repeating the above-mentioned steps, and testing other induction lines in sequence. According to the method, it is not necessary to reserve a space for manufacturing a shorting bar on a mother substrate of a touchscreen, so that the space on the mother substrate is saved, the operation is simple, the test process is simple, and the short-circuit state of each induction line in the capacitive touchscreen can be tested.</p> |
