发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 A method of forming a semiconductor device includes forming a gate structure including a polysilicon gate and forming a capping spacer on a side surface of the gate structure to prevent parasitic epitaxial growth on the side surface of the polysilicon gate.
申请公布号 US2015126012(A1) 申请公布日期 2015.05.07
申请号 US201414313039 申请日期 2014.06.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Jeong Yeong-Jong;Lee Jeong-Yun;Quan Shi Li
分类号 H01L29/66;H01L21/28 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for fabricating a semiconductor device comprising: forming a gate structure, in which a polysilicon gate and a hard mask are stacked and which includes an upper portion and a lower portion, on a substrate; forming a gate spacer on a side surface of the gate structure; forming a sacrificial layer, which surrounds a part of the gate spacer and the lower portion of the gate structure, on the substrate; forming a capping spacer on a side surface of the upper portion of the gate structure that projects beyond the sacrificial layer; and removing the sacrificial layer after forming the capping spacer.
地址 SUWON-SI KR