发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
A method of forming a semiconductor device includes forming a gate structure including a polysilicon gate and forming a capping spacer on a side surface of the gate structure to prevent parasitic epitaxial growth on the side surface of the polysilicon gate. |
申请公布号 |
US2015126012(A1) |
申请公布日期 |
2015.05.07 |
申请号 |
US201414313039 |
申请日期 |
2014.06.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Jeong Yeong-Jong;Lee Jeong-Yun;Quan Shi Li |
分类号 |
H01L29/66;H01L21/28 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor device comprising:
forming a gate structure, in which a polysilicon gate and a hard mask are stacked and which includes an upper portion and a lower portion, on a substrate; forming a gate spacer on a side surface of the gate structure; forming a sacrificial layer, which surrounds a part of the gate spacer and the lower portion of the gate structure, on the substrate; forming a capping spacer on a side surface of the upper portion of the gate structure that projects beyond the sacrificial layer; and removing the sacrificial layer after forming the capping spacer. |
地址 |
SUWON-SI KR |