发明名称 STRESS MEASUREMENT SYSTEM, STRESS MEASUREMENT METHOD AND STRESS MEASUREMENT PROCESSOR
摘要 <p>PROBLEM TO BE SOLVED: To simplify a configuration, and to improve measuring accuracy.SOLUTION: A stress measurement system includes: an infrared camera 63; and a processor 65 for performing image processing to a time series image GA1 imaged by the infrared camera 63. The processor 65 includes: a storage part 651; an image acquisition part 652; an FFT part 653; a filter processing part 654; and an inverse FFT part 655. The FFT part 653 generates first frequency data by performing Fourier transformation processing to the first time series data of each of pixels configuring the first time series image GA1. The filter processing part 654 generates second frequency data by performing filter processing to the first frequency data. The inverse FFT part 655 generates the second time series data of each pixel by performing inverse Fourier transformation processing to the second frequency data, and stores this in the storage part 651.</p>
申请公布号 JP2015087375(A) 申请公布日期 2015.05.07
申请号 JP20140102614 申请日期 2014.05.16
申请人 JTEKT CORP 发明人 OKUBO YUSUKE;RO REIMEI;YAMADA KAZUAKI
分类号 G01L1/00 主分类号 G01L1/00
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