Memory module and a memory test system for testing the same

摘要

A memory module includes a first rank, a second rank and a test control unit. The first rank includes a plurality of semiconductor memory devices configured to operate in response to a first chip selection signal. The second rank includes a plurality of semiconductor memory devices configured to operate in response to a second chip selection signal. The test control unit is configured to simultaneously enable the first and second chip selection signals to test the first and second ranks in a test mode.

主权项

1. A memory module, comprising:
a first rank which comprises a plurality of semiconductor memory devices configured to operate in response to a first chip selection signal; a second rank which comprises a plurality of semiconductor memory devices configured to operate in response to a second chip selection signal; and a test control unit configured to receive first and second rank selection signals respectively corresponding to the first and second ranks from an external source, wherein the test control unit is configured to simultaneously enable the first and second chip selection signals to test the first and second ranks in a test mode in response to the first rank selection signal which is enabled.