发明名称 Resist composition and method of forming resist pattern
摘要 A resist composition which generates a base upon exposure and exhibits increased solubility in an alkali developing solution under the action of acid, and the resist composition including: a base component (A) that exhibits increased solubility in an alkali developing solution under the action of acid; an acidic compound component (G1) including a nitrogen-containing cation having a pKa value of 7 or less and a counteranion; and a buffer component (K) including a nitrogen-containing cation and a counteranion being a conjugate base for the acid having a pKa value of 0 to 5.
申请公布号 US9023585(B2) 申请公布日期 2015.05.05
申请号 US201313922758 申请日期 2013.06.20
申请人 Tokyo Ohka Kogyo Co., Ltd 发明人 Nakamura Tsuyoshi;Yokoya Jiro;Nito Hideto;Shimizu Hiroaki
分类号 G03F7/004;G03F7/039;G03F7/20;G03F7/30;G03F7/38 主分类号 G03F7/004
代理机构 Knobbe Martens Olson & Bear, LLP 代理人 Knobbe Martens Olson & Bear, LLP
主权项 1. A resist composition which generates a base upon exposure and exhibits increased solubility in an alkali developing solution under the action of acid, the resist composition comprising: a base component (A) that exhibits increased solubility in an alkali developing solution under the action of acid; an acidic compound component (G1) comprising a nitrogen-containing cation having a pKa value of 7 or less and a counteranion; and a buffer component (K) comprising a nitrogen-containing cation and a counteranion being a conjugate base for an acid having a pKa value of 0 to 5.
地址 Kawasaki-shi JP