发明名称 |
Resist composition and method of forming resist pattern |
摘要 |
A resist composition which generates a base upon exposure and exhibits increased solubility in an alkali developing solution under the action of acid, and the resist composition including: a base component (A) that exhibits increased solubility in an alkali developing solution under the action of acid; an acidic compound component (G1) including a nitrogen-containing cation having a pKa value of 7 or less and a counteranion; and a buffer component (K) including a nitrogen-containing cation and a counteranion being a conjugate base for the acid having a pKa value of 0 to 5. |
申请公布号 |
US9023585(B2) |
申请公布日期 |
2015.05.05 |
申请号 |
US201313922758 |
申请日期 |
2013.06.20 |
申请人 |
Tokyo Ohka Kogyo Co., Ltd |
发明人 |
Nakamura Tsuyoshi;Yokoya Jiro;Nito Hideto;Shimizu Hiroaki |
分类号 |
G03F7/004;G03F7/039;G03F7/20;G03F7/30;G03F7/38 |
主分类号 |
G03F7/004 |
代理机构 |
Knobbe Martens Olson & Bear, LLP |
代理人 |
Knobbe Martens Olson & Bear, LLP |
主权项 |
1. A resist composition which generates a base upon exposure and exhibits increased solubility in an alkali developing solution under the action of acid,
the resist composition comprising: a base component (A) that exhibits increased solubility in an alkali developing solution under the action of acid; an acidic compound component (G1) comprising a nitrogen-containing cation having a pKa value of 7 or less and a counteranion; and a buffer component (K) comprising a nitrogen-containing cation and a counteranion being a conjugate base for an acid having a pKa value of 0 to 5. |
地址 |
Kawasaki-shi JP |