发明名称 Lattice-Mismatched Semiconductor Structures and Related Methods for Device Fabrication
摘要 Lattice-mismatched materials having configurations that trap defects within sidewall-containing structures.
申请公布号 US2015115320(A1) 申请公布日期 2015.04.30
申请号 US201414506091 申请日期 2014.10.03
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lochtefeld Anthony J.
分类号 H01L21/02;H01L29/165;H01L29/267;H01L29/06 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method comprising: forming disconnected pillars on a substrate, the substrate comprising a first crystalline semiconductor material, the disconnected pillars comprising a non-crystalline material; and epitaxially growing a second crystalline semiconductor material on the substrate and between the disconnected pillars, the second crystalline semiconductor material being lattice mismatched to the first crystalline semiconductor material, dislocations arising from the lattice mismatch in the second crystalline semiconductor material terminating at the disconnected pillars, the second crystalline semiconductor material being grown over the disconnected pillars to form a continuous layer.
地址 Hsin-Chu TW