发明名称 |
OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE |
摘要 |
This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other. |
申请公布号 |
WO2014158290(A8) |
申请公布日期 |
2015.04.30 |
申请号 |
WO2014US00069 |
申请日期 |
2014.03.31 |
申请人 |
LABUDA, ALEKSANDER;CLEVELAND, JASON;WALTERS, DERON;PROKSCH, ROGER |
发明人 |
LABUDA, ALEKSANDER;CLEVELAND, JASON;WALTERS, DERON;PROKSCH, ROGER |
分类号 |
G01B5/28 |
主分类号 |
G01B5/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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