发明名称 SYSTEMS AND METHODS FOR DETERMINING RISK EXPOSURE
摘要 Systems and methods of the present technology provide the capability to determine risk exposure of points of interest (e.g., insured locations) based on the occurrence of an event (e.g., a catastrophic event). The systems and methods use two-dimensional convolution and FFT processing to provide quick determinations.
申请公布号 US2015120332(A1) 申请公布日期 2015.04.30
申请号 US201314062277 申请日期 2013.10.24
申请人 AON BENFIELD, INC. 发明人 MILDENHALL STEPHEN JOHN MARTIN;DYBVIK KIRK WILLIAM
分类号 G06Q40/08 主分类号 G06Q40/08
代理机构 代理人
主权项 1. A method of determining risk exposure associated with points of interest, said method comprising the steps of: generating, by a computing device, a first grid comprising cells with exposure totals for points of interest within the cells; generating, by the computing device, a second grid corresponding to an event footprint, the second grid comprising cells, each cell having a coverage factor determined by the event footprint; and applying, by the computing device, the second grid to the first grid in a convolution process to determine the risk exposure of each cell within the first grid.
地址 Chicago IL US