发明名称 |
Techniques for providing a semiconductor memory device |
摘要 |
Techniques for providing a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. Each memory cell including a first region, a second region, and a body region capacitively coupled to at least one word line and disposed between the first region and the second region. Each memory cell also including a third region, wherein the third region may be doped differently than the first region, the second region, and the body region. |
申请公布号 |
US9019759(B2) |
申请公布日期 |
2015.04.28 |
申请号 |
US201314043833 |
申请日期 |
2013.10.01 |
申请人 |
Micron Technology, Inc. |
发明人 |
Banna Srinivasa R.;Van Buskirk Michael A.;Thurgate Timothy |
分类号 |
G11C11/34;G11C7/00;H01L27/105;H01L27/12;H01L29/78;H01L27/108 |
主分类号 |
G11C11/34 |
代理机构 |
Wilmer Cutler Pickering Hale and Dorr LLP |
代理人 |
Wilmer Cutler Pickering Hale and Dorr LLP |
主权项 |
1. A method for biasing a semiconductor memory device comprising the steps of:
applying a first voltage potential to a first region of a first memory cell in an array of memory cells via a respective source line of the array; applying a second voltage potential to a second region of the first memory cell via a respective bit line of the array; applying a third voltage potential to a body region of the first memory cell via at least one respective word line of the array that is capacitively coupled to the body region; and applying a fourth voltage potential to a third region of the first memory cell via a respective carrier injection line of the array; wherein the first region, the second region, and the body region have a common first doping polarity. |
地址 |
Boise ID US |