发明名称 SEMICONDUCTOR DEVICE
摘要 To provide a semiconductor device that is suitable for miniaturization. The semiconductor device includes a first transistor, a second transistor over the first transistor, a barrier layer between the first transistor and the second transistor, a first electrode between the first transistor and the barrier layer, and a second electrode between the hairier layer and the second transistor and overlapping the first electrode with the barrier layer therebetween. A gate electrode of the first transistor, the first electrode, one of a source electrode and a drain electrode of the second transistor are electrically connected to one another. A channel is formed in a first semiconductor layer including a single crystal semiconductor in the first transistor, A channel is formed in a second semiconductor layer including an oxide semiconductor in the second transistor.
申请公布号 US2015108470(A1) 申请公布日期 2015.04.23
申请号 US201414515993 申请日期 2014.10.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 Yamazaki Shunpei;Nagatsuka Shuhei;Onuki Tatsuya;Shionoiri Yutaka;Kato Kiyoshi;Miyairi Hidekazu
分类号 H01L27/12;H01L29/786 主分类号 H01L27/12
代理机构 代理人
主权项 1. A semiconductor device comprising: a first transistor; a second transistor over the first transistor; a barrier layer between the first transistor and the second transistor; a first electrode between the first transistor and the barrier layer; and a second electrode between the barrier layer and the second transistor and overlapping the first electrode with the barrier layer therebetween, wherein a first semiconductor layer included in the first transistor is made of a single crystal semiconductor and comprises a channel formation region of the first transistor, and wherein a second semiconductor layer included in the second transistor comprises an oxide semiconductor and a channel formation region of the second transistor.
地址 Atsugh-shi JP