发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
To provide a semiconductor device that is suitable for miniaturization. The semiconductor device includes a first transistor, a second transistor over the first transistor, a barrier layer between the first transistor and the second transistor, a first electrode between the first transistor and the barrier layer, and a second electrode between the hairier layer and the second transistor and overlapping the first electrode with the barrier layer therebetween. A gate electrode of the first transistor, the first electrode, one of a source electrode and a drain electrode of the second transistor are electrically connected to one another. A channel is formed in a first semiconductor layer including a single crystal semiconductor in the first transistor, A channel is formed in a second semiconductor layer including an oxide semiconductor in the second transistor. |
申请公布号 |
US2015108470(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201414515993 |
申请日期 |
2014.10.16 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
Yamazaki Shunpei;Nagatsuka Shuhei;Onuki Tatsuya;Shionoiri Yutaka;Kato Kiyoshi;Miyairi Hidekazu |
分类号 |
H01L27/12;H01L29/786 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first transistor; a second transistor over the first transistor; a barrier layer between the first transistor and the second transistor; a first electrode between the first transistor and the barrier layer; and a second electrode between the barrier layer and the second transistor and overlapping the first electrode with the barrier layer therebetween, wherein a first semiconductor layer included in the first transistor is made of a single crystal semiconductor and comprises a channel formation region of the first transistor, and wherein a second semiconductor layer included in the second transistor comprises an oxide semiconductor and a channel formation region of the second transistor. |
地址 |
Atsugh-shi JP |