发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To prevent generation of junction leakage current and decrease in on-state current and decrease manufacturing cost.SOLUTION: A semiconductor device comprises: at least two first grooves which extend in a semiconductor substrate 1 in one direction; at least two second grooves which extend in the one direction and are provided between the two first grooves and have depths each shallower than that of the first groove; a first insulation film 8 formed on inner wall surfaces of the first and second grooves; dummy gate electrodes 12 embedded in respective first grooves; gate electrodes 11 embedded in respective second grooves; and a second insulation film in which the first and second grooves are substantially and completely buried. A top face of the dummy gate electrode 12 lies at a position deeper than a top face of the gate electrode 11.</p> |
申请公布号 |
JP2015079865(A) |
申请公布日期 |
2015.04.23 |
申请号 |
JP20130216389 |
申请日期 |
2013.10.17 |
申请人 |
MICRON TECHNOLOGY INC |
发明人 |
SUKEGAWA MITSUNARI;OSHIMA HIROMITSU |
分类号 |
H01L21/8242;H01L21/336;H01L21/76;H01L27/108;H01L29/78 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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