发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To prevent generation of junction leakage current and decrease in on-state current and decrease manufacturing cost.SOLUTION: A semiconductor device comprises: at least two first grooves which extend in a semiconductor substrate 1 in one direction; at least two second grooves which extend in the one direction and are provided between the two first grooves and have depths each shallower than that of the first groove; a first insulation film 8 formed on inner wall surfaces of the first and second grooves; dummy gate electrodes 12 embedded in respective first grooves; gate electrodes 11 embedded in respective second grooves; and a second insulation film in which the first and second grooves are substantially and completely buried. A top face of the dummy gate electrode 12 lies at a position deeper than a top face of the gate electrode 11.</p>
申请公布号 JP2015079865(A) 申请公布日期 2015.04.23
申请号 JP20130216389 申请日期 2013.10.17
申请人 MICRON TECHNOLOGY INC 发明人 SUKEGAWA MITSUNARI;OSHIMA HIROMITSU
分类号 H01L21/8242;H01L21/336;H01L21/76;H01L27/108;H01L29/78 主分类号 H01L21/8242
代理机构 代理人
主权项
地址