发明名称 IN-BAND OSNR MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
摘要 There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.
申请公布号 US2015110486(A1) 申请公布日期 2015.04.23
申请号 US201414223165 申请日期 2014.03.24
申请人 EXFO INC. 发明人 Sunnerud Henrik;Skold Mats;Westlund Mathias
分类号 H04B10/079;H04J14/06 主分类号 H04B10/079
代理机构 代理人
主权项 1. A method for determining an in-band noise parameter on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution, the method comprising: for each of a multiplicity of distinct polarization-analyzer conditions, analyzing said SUT to provide at least one polarization-analyzed component of the SUT and detecting said at least one component with an electronic bandwidth at least ten times smaller than the symbol rate of said SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, determining a value of a statistical parameter from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to said multiplicity of distinct polarization-analyzer conditions; and mathematically determining, from the set of statistical-parameter values, said in-band noise parameter representative of said optical noise contribution.
地址 Quebec CA