发明名称 |
IN-BAND OSNR MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS |
摘要 |
There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined. |
申请公布号 |
US2015110486(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201414223165 |
申请日期 |
2014.03.24 |
申请人 |
EXFO INC. |
发明人 |
Sunnerud Henrik;Skold Mats;Westlund Mathias |
分类号 |
H04B10/079;H04J14/06 |
主分类号 |
H04B10/079 |
代理机构 |
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代理人 |
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主权项 |
1. A method for determining an in-band noise parameter on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution, the method comprising:
for each of a multiplicity of distinct polarization-analyzer conditions, analyzing said SUT to provide at least one polarization-analyzed component of the SUT and detecting said at least one component with an electronic bandwidth at least ten times smaller than the symbol rate of said SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, determining a value of a statistical parameter from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to said multiplicity of distinct polarization-analyzer conditions; and mathematically determining, from the set of statistical-parameter values, said in-band noise parameter representative of said optical noise contribution. |
地址 |
Quebec CA |