发明名称 CMP POLISHING PAD HAVING EDGE EXCLUSION REGION OF OFFSET CONCENTRIC GROOVE PATTERN
摘要 <p>The invention provides a polishing pad and a method of using the polishing pad for chemically-mechanically polishing a substrate. The polishing pad comprises at least a grooved region and an exclusion region, wherein the exclusion region is adjacent to the circumference of the polishing pad, and wherein the exclusion region is devoid of grooves.</p>
申请公布号 WO2015057432(A1) 申请公布日期 2015.04.23
申请号 WO2014US59591 申请日期 2014.10.08
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 TSAI, CHING-MING;CHENG, SHI-WEI;HSU, JIA-CHENG;YANG, KUN-SHU;CHEN, HUI-FENG;GAUDET, GREGORY;LIU, SHENG-HUAN
分类号 H01L21/304;B24B37/20 主分类号 H01L21/304
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