发明名称 Solid state drive tester
摘要 Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.
申请公布号 US9015545(B2) 申请公布日期 2015.04.21
申请号 US201313921753 申请日期 2013.06.19
申请人 Unitest Inc 发明人 Lee Eui Won;Oh Hyo Jin
分类号 G01R31/28;G11C29/10;G06F11/22;G06F13/38;G06F13/40;G11C29/56;G11C29/04 主分类号 G01R31/28
代理机构 Novick, Kim & Lee, PLLC 代理人 Novick, Kim & Lee, PLLC ;Kim Jae Youn
主权项 1. A solid state drive tester comprising: a host terminal for receiving a test condition for testing a storage from a user; and a test control unit generating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.
地址 Yongin-si, Gyeonggi-do KR