发明名称 Thin film transistors formed by organic semiconductors using a hybrid patterning regime
摘要 The present disclosure describes a process strategy for forming bottom gate/bottom contact organic TFTs in CMOS technology by using a hybrid deposition/patterning regime. To this end, gate electrodes, gate dielectric materials and drain and source electrodes are formed on the basis of lithography processes, while the organic semiconductor materials are provided as the last layers by using a spatially selective printing process.
申请公布号 US9012259(B2) 申请公布日期 2015.04.21
申请号 US201414157097 申请日期 2014.01.16
申请人 STMicroelectronics S.r.l. 发明人 Foncellino Francesco;Salzillo Giovanna;Casuscelli Valeria;Occhipinti Luigi Giuseppe
分类号 H01L51/40;H01L51/05;H01L51/00 主分类号 H01L51/40
代理机构 Seed IP Law Group PLLC 代理人 Seed IP Law Group PLLC
主权项 1. A method comprising: forming a thin-film transistor, wherein forming the thin-film transistor includes: using lithography techniques, forming a gate electrode, a gate dielectric, and source and drain electrodes above a substrate; andusing a printing process, forming a patterned organic semiconductor material above the substrate and surrounding the source and drain electrodes.
地址 Agrate Brianza IT