发明名称 PRODUCTION METHOD OF RESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a production method of a resist composition, by which a resist composition with reduced coating defects can be produced.SOLUTION: A production method of a resist composition to be used for a process of manufacturing a semiconductor device is provided, which includes steps of: cleaning an apparatus for producing the resist composition with a cleaning solution; extracting the cleaning solution from the production apparatus and analyzing; further cleaning the apparatus until a concentration of a nonvolatile component included in the cleaning solution is decreased to 10 ppm or lower; and then producing the resist composition in the production apparatus.
申请公布号 JP2015072418(A) 申请公布日期 2015.04.16
申请号 JP20130208915 申请日期 2013.10.04
申请人 SHIN ETSU CHEM CO LTD 发明人 IWABUCHI MOTOAKI;OGIWARA TSUTOMU;HOSHI YUKIO;BIYAJIMA YUSUKE
分类号 G03F7/26;G03F7/075;G03F7/11 主分类号 G03F7/26
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