发明名称 |
PRODUCTION METHOD OF RESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a production method of a resist composition, by which a resist composition with reduced coating defects can be produced.SOLUTION: A production method of a resist composition to be used for a process of manufacturing a semiconductor device is provided, which includes steps of: cleaning an apparatus for producing the resist composition with a cleaning solution; extracting the cleaning solution from the production apparatus and analyzing; further cleaning the apparatus until a concentration of a nonvolatile component included in the cleaning solution is decreased to 10 ppm or lower; and then producing the resist composition in the production apparatus. |
申请公布号 |
JP2015072418(A) |
申请公布日期 |
2015.04.16 |
申请号 |
JP20130208915 |
申请日期 |
2013.10.04 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
IWABUCHI MOTOAKI;OGIWARA TSUTOMU;HOSHI YUKIO;BIYAJIMA YUSUKE |
分类号 |
G03F7/26;G03F7/075;G03F7/11 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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