发明名称 Device for Contactlessly Testing Passive Routing Substrates
摘要 A device is provided for detecting passive routing substrates. Thermal behavior deference before and after an passive routing substrate is damaged is used. Thus, a batch of passive routing substrates can be detected. The present invention does not run functional test. In addition, the passive routing substrates are not contacted and would not be damaged on detection. Thus, the present invention is used for superior and precise detection before stacking the passive routing substrates.
申请公布号 US2015103161(A1) 申请公布日期 2015.04.16
申请号 US201314101521 申请日期 2013.12.10
申请人 National Tsing Hua University 发明人 Chien Jui-Hung;Yu Hao;Hsu Ruei-Siang;Lin Hsueh-Ju;Chang Shih-Chieh
分类号 G06T7/00;H04N5/33 主分类号 G06T7/00
代理机构 代理人
主权项 1. A device of detecting passive routing substrates without contacting, comprising a heater, said heater heating up a plurality of passive routing substrates; an image capture device, said image capture device being connected with said heater, said image capture device sequentially capturing a thermal image of each of said passive routing substrates to display temperature distribution of said thermal image with different colors; a plurality of noise filters, said noise filters being connected with said image capture device, said noise filters separately filtering noise of said thermal images of said passive routing substrates; a plurality of differential filters, said differential filters being connected with said noise filters, wherein every two neighboring differential filters compare corresponding neighboring two of said thermal images to obtain thermal behavior changing points in between to obtain a thermal behavior difference image of said two of said thermal images; and a comparison module, said comparison module being connected with said differential filters, said comparison module receiving said thermal behavior difference images, said comparison module comprising a first comparator and a second comparator, said second comparator being connected with said first comparator, said first comparator comparing at least two of said thermal behavior difference images to obtain a good passive routing substrate according to distribution of said thermal behavior changing points between said at least two of said thermal behavior difference images, said second comparator comparing said thermal behavior difference image of said good passive routing substrate with each of the other ones of said thermal behavior difference images to estimate a yield of said passive routing substrates.
地址 Hsinchu City TW