发明名称 High Voltage Isolation of an Inductively Coupled Plasma Ion Source with a Liquid that is not Actively Pumped
摘要 An inductively-coupled plasma source for a focused charged particle beam system includes a plasma chamber and a fluid that is not actively pumped surrounding the plasma chamber for providing high voltage isolation between the plasma chamber and nearby parts which are at ground potential, such as a conductive shield. One or more cooling devices cool the plasma chamber by using evaporative cooling and heat pipes to dissipate the heat from the plasma chamber into a surrounding environment.
申请公布号 US2015102230(A1) 申请公布日期 2015.04.16
申请号 US201214128030 申请日期 2012.06.21
申请人 Kellogg Sean;Wells Andrew B.;Mcginn James B.;Parker N. William;Utlaut Mark W. 发明人 Kellogg Sean;Wells Andrew B.;Mcginn James B.;Parker N. William;Utlaut Mark W.
分类号 H05H1/24 主分类号 H05H1/24
代理机构 代理人
主权项 1. A charged particle beam system, comprising: a plasma source having: a plasma chamber having a wall composed of a dielectric material, the wall having an interior surface and an exterior surface;a conductor coiled at least one time around the plasma chamber;a fluid surrounding and in thermal contact with at least a portion of the plasma chamber, in which the fluid is not actively pumped; anda source electrode for electrically biasing the plasma to a high voltage; and one or more focusing lenses for focusing charged particles from the plasma source onto a sample.
地址 Portland OR US