发明名称 |
High Voltage Isolation of an Inductively Coupled Plasma Ion Source with a Liquid that is not Actively Pumped |
摘要 |
An inductively-coupled plasma source for a focused charged particle beam system includes a plasma chamber and a fluid that is not actively pumped surrounding the plasma chamber for providing high voltage isolation between the plasma chamber and nearby parts which are at ground potential, such as a conductive shield. One or more cooling devices cool the plasma chamber by using evaporative cooling and heat pipes to dissipate the heat from the plasma chamber into a surrounding environment. |
申请公布号 |
US2015102230(A1) |
申请公布日期 |
2015.04.16 |
申请号 |
US201214128030 |
申请日期 |
2012.06.21 |
申请人 |
Kellogg Sean;Wells Andrew B.;Mcginn James B.;Parker N. William;Utlaut Mark W. |
发明人 |
Kellogg Sean;Wells Andrew B.;Mcginn James B.;Parker N. William;Utlaut Mark W. |
分类号 |
H05H1/24 |
主分类号 |
H05H1/24 |
代理机构 |
|
代理人 |
|
主权项 |
1. A charged particle beam system, comprising:
a plasma source having:
a plasma chamber having a wall composed of a dielectric material, the wall having an interior surface and an exterior surface;a conductor coiled at least one time around the plasma chamber;a fluid surrounding and in thermal contact with at least a portion of the plasma chamber, in which the fluid is not actively pumped; anda source electrode for electrically biasing the plasma to a high voltage; and one or more focusing lenses for focusing charged particles from the plasma source onto a sample. |
地址 |
Portland OR US |