NON-CONTACT PROBE MEASUREMENT TEST BED FOR MILLIMETER WAVE AND TERAHERTZ CIRCUITS, INTEGRATED DEVICES/COMPONENTS, SYSTEMS FOR SPECTROSCOPY USING SUB-WAVELENGTH-SIZE-SAMPLES

摘要

A test fixture for characterizing a device-under-test (DUT) includes first and second planar antennas and a planar waveguide arranged to guide terahertz (THz) and/or millimeter wave (mmW) radiation between the first and second planar antennas. The planar waveguide is further configured to couple THz and/or mmW radiation guided between the first and second planar antennas with the DUT. A beam forming apparatus is arranged to transmit a probe THz and/or mmW radiation beam to the first planar antenna of the test fixture. An electronic analyzer is configured to wirelessly receive a THz and/or mmW signal emitted by the second planar antenna responsive to transmission of the probe THz and/or mmW radiation beam to the first planar antenna. The planar antennas may be asymmetrical beam-tilted slot antennas.

主权项

1. An apparatus for performing terahertz (THz) or millimeter wave (mmW) characterization of an associated device-under-test (DUT), the apparatus comprising:
a test fixture including:
first and second planar antennas, anda planar waveguide arranged to guide THz or mmW radiation between the first and second planar antennas and further configured to couple THz or mmW radiation guided between the first and second planar antennas with the associated DUT; a beam forming apparatus arranged to transmit a probe THz or mmW beam to the first planar antenna of the test fixture; and an electronic analyzer configured to wirelessly receive a THz or mmW signal emitted by the second planar antenna responsive to transmission of the probe THz or mmW beam to the first planar antenna.