发明名称 半導体装置
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device which can improve connection reliability with a wiring board. <P>SOLUTION: Manufacturing of a semiconductor device comprises: forming grooves 18 each having a predetermined width by a dicing saw 17 on a frame part 13 of a lead frame 11 encapsulated by an encapsulation resin 15 along dicing lines 16 from an undersurface 132 side of the frame part 13; subsequently, forming plating layers 19 on bottom faces 181 and lateral faces 183 of the grooves 18, on undersurfaces 32 of die pads 3 and undersurfaces 142 of the leads 14; removing the frame part 13 and encapsulation resin 15 in a penetrating manner along the dicing lines 16 by using a dicing saw 20 having a width narrower than a width of the groove 18. As a result, pieces of the semiconductor devices 1 each having a lead plating layer 10 formed on an inner end face 832 of a body part 8 of the lead 4 can be obtained. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5702763(B2) 申请公布日期 2015.04.15
申请号 JP20120253597 申请日期 2012.11.19
申请人 发明人
分类号 H01L23/50;H01L23/12;H01L23/28 主分类号 H01L23/50
代理机构 代理人
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