发明名称 |
Method of preparing semiconductor layer including cavities |
摘要 |
A method of fabricating a semiconductor substrate, includes forming a first semiconductor layer on a substrate, forming a metallic material layer on the first semiconductor layer, forming a second semiconductor layer on the first semiconductor layer and the metallic material layer, etching the substrate using a solution to remove the metallic material layer and a portion of the first semiconductor layer, and forming a cavity in the first semiconductor layer under where the metallic material layer was removed. |
申请公布号 |
US9006084(B2) |
申请公布日期 |
2015.04.14 |
申请号 |
US201213507210 |
申请日期 |
2012.06.13 |
申请人 |
Seoul Viosys Co., Ltd. |
发明人 |
Sakai Shiro |
分类号 |
H01L21/46;H01L21/02;C30B25/02;C30B29/40;H01L29/20;H01L33/00 |
主分类号 |
H01L21/46 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A method of fabricating a light emitting device using a recycled substrate, the method comprising:
forming a plurality of compound semiconductor layers on a first substrate, the compound semiconductor layers comprising a first semiconductor layer; forming a patterned layer on the first semiconductor layer, the patterned layer comprising a metallic layer; forming a second semiconductor layer on the first semiconductor layer, wherein a plurality of cavities are formed in the first semiconductor layer while forming the second semiconductor layer; depositing a second substrate on the plurality of compound semiconductor layers, after forming the plurality of compound semiconductor layers on the first substrate; separating the first substrate from the plurality of compound semiconductor layers at the first semiconductor layer, thereby exposing a first surface of the first semiconductor layer; and removing the first semiconductor layer, wherein separating the first substrate from the plurality of compound semiconductor layers comprises:
etching both the first semiconductor layer, to increase the volume of each of the plurality of the cavities, and at least a part of the patterned layer, using a chemical solution, before removing the first semiconductor layer. |
地址 |
Ansan-si KR |