发明名称 Sample measurement system
摘要 The invention relates to an apparatus and method for optically analyzing samples contained in sample sites of a sample holder by means of fluorescence. The apparatus comprises a first light source comprising a plurality of individual light sources having narrow wavelength bands, means for further limiting wavelength bands of the light emitted by the individual light sources, means for guiding the reduced-wavelength light to the sample sites of the sample holder, and a detector for detecting light from the sample sites. According to the invention said means for further reducing the wavelength bands emitted by the individual light sources comprise a wavelength-tunable single monochromator. The invention allows manufacturing of a microplate reader having the capability for fluorescence measurements at a continuous wavelength range, while maintaining the cost of the device at a reasonable level.
申请公布号 US9006684(B2) 申请公布日期 2015.04.14
申请号 US200812738843 申请日期 2008.10.08
申请人 PerkinElmer Singapore Pte. Ltd. 发明人 Laitinen Jyrki;Kivelä Petri
分类号 G01J1/58;G01N21/64;G01J3/02;G01J3/10;G01J3/18;G01J3/44;G01N21/25 主分类号 G01J1/58
代理机构 Seppo Laine Oy 代理人 Seppo Laine Oy ;Wert Joshua P.
主权项 1. An apparatus for optically analyzing samples contained in sample sites of a sample holder by means of fluorescence, comprising a light source comprising a plurality of individual light sources having narrow wavelength bands, a light source selector for selecting light from one of the individual light sources by selecting and connecting an optical fiber with light from one of said individual light sources, a wavelength-tunable single monochromator for further reducing the wavelength band of the light emitted by said selected individual light source, means for guiding the reduced selected individual light source light to the sample sites of the sample holder, and a detector for detecting light from the sample sites.
地址 Singapore SG