发明名称 ENABLING HIGH ACTIVATION OF DOPANTS IN INDIUM-ALUMINUM-GALIUM-NITRIDE MATERIAL SYSTEM USING HOT IMPLANTATION AND NANOSECOND ANNEALING
摘要 Embodiments of the present disclosure generally relate to doping and annealing substrates. The substrates may be doped during a hot implantation process, and subsequently annealed using a nanosecond annealing process. The combination of hot implantation and nanosecond annealing reduces lattice damage of the substrates and facilitates a higher dopant concentration near the surface of the substrate to facilitate increased electrical contact with the substrate. An optional capping layer may be placed over the substrate to reduce outgassing of dopants or to control dopant implant depth.
申请公布号 US2015099350(A1) 申请公布日期 2015.04.09
申请号 US201414503631 申请日期 2014.10.01
申请人 Applied Materials, Inc. 发明人 SRINIVASAN Swaminathan T.;KHAJA Fareen Adeni
分类号 H01L21/265;H01L21/324 主分类号 H01L21/265
代理机构 代理人
主权项 1. A method of processing a substrate, comprising: implanting a dopant into a substrate during a hot implant process, wherein during the hot implant process the substrate is maintained at a temperature within a range of about 80 degrees Celsius to about 600 degrees Celsius; and annealing the substrate during a nanosecond annealing process to activate the dopant and to repair crystalline defects in the substrate, wherein during the nanosecond annealing process the substrate is exposed to one or more pulses of laser energy each having a duration less than about 10 microseconds and the substrate remains solid.
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