发明名称 |
METHOD OF MANUFACTURING SINGLE-CRYSTAL INGOT, METHOD OF MANUFACTURING SINGLE-CRYSTAL SUBSTRATE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a single-crystal ingot which has less crystal defects.SOLUTION: A first single-crystal ingot 12 is grown on a first seed crystal 11 provided with a first plane PL1 perpendicular to a {0001} plane. A second seed crystal 21 provided with a second plane PL2 having an off angle of less than 10° from the {0001} plane is cut out of the first single-crystal ingot 12. The process of growing the first single-crystal ingot 12 is so carried out that variation in <0001> orientation of the second seed crystal 21 in a range of 10 mm square of the second plane PL2 is less than 0.15°. A second single-crystal ingot 22 is grown on the second seed crystal 21. |
申请公布号 |
JP2015063435(A) |
申请公布日期 |
2015.04.09 |
申请号 |
JP20130199567 |
申请日期 |
2013.09.26 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
KOSHO TOMOAKI;SUZUKI HIROYOSHI |
分类号 |
C30B29/36;C30B23/06;C30B33/00;H01L21/205;H01L29/12;H01L29/78 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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