发明名称 STRUCTURES, APPARATUSES AND METHODS FOR FABRICATING SENSORS IN MULTI-LAYER STRUCTURES
摘要 Structures, apparatuses, and methods are provided for fabricating a semiconductor device structure. An example semiconductor device structure includes a first substrate, a first device layer, a second device layer and a third device layer. The first device layer may be on the first substrate and include a switch. The second device layer may be on the first device layer and include a sensing device. The third device layer may include one or more inter-level connection structures configured to electrically connect the switch to the sensing device. The switch may be configured to be electrically turned on in response to a selection signal. The sensing device may be configured to generate an output signal in response to the switch being turned on.
申请公布号 US2015097214(A1) 申请公布日期 2015.04.09
申请号 US201314049284 申请日期 2013.10.09
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 CHEN TUNG-TSUN;HUANG JUI-CHENG
分类号 G01N27/414 主分类号 G01N27/414
代理机构 代理人
主权项 1. A semiconductor device structure comprising: a first substrate; a first device layer on the first substrate, the first device layer including a switch; a second device layer on the first device layer, the second device layer including a sensing device; and a third device layer including one or more inter-level connection structures configured to electrically connect the switch to the sensing device; wherein: the switch is configured to be electrically turned on in response to a selection signal; andthe sensing device is configured to generate an output signal in response to the switch being turned on.
地址 Hsinchu TW