发明名称 |
STRUCTURES, APPARATUSES AND METHODS FOR FABRICATING SENSORS IN MULTI-LAYER STRUCTURES |
摘要 |
Structures, apparatuses, and methods are provided for fabricating a semiconductor device structure. An example semiconductor device structure includes a first substrate, a first device layer, a second device layer and a third device layer. The first device layer may be on the first substrate and include a switch. The second device layer may be on the first device layer and include a sensing device. The third device layer may include one or more inter-level connection structures configured to electrically connect the switch to the sensing device. The switch may be configured to be electrically turned on in response to a selection signal. The sensing device may be configured to generate an output signal in response to the switch being turned on. |
申请公布号 |
US2015097214(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
US201314049284 |
申请日期 |
2013.10.09 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
CHEN TUNG-TSUN;HUANG JUI-CHENG |
分类号 |
G01N27/414 |
主分类号 |
G01N27/414 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device structure comprising:
a first substrate; a first device layer on the first substrate, the first device layer including a switch; a second device layer on the first device layer, the second device layer including a sensing device; and a third device layer including one or more inter-level connection structures configured to electrically connect the switch to the sensing device; wherein:
the switch is configured to be electrically turned on in response to a selection signal; andthe sensing device is configured to generate an output signal in response to the switch being turned on. |
地址 |
Hsinchu TW |