发明名称 Device for the non-destructive testing of an electrically conductive structure
摘要 A device for non-destructive testing of an electrically conductive part including: an induction portion, a receiving portion, and a processor. The induction portion includes an inductor dissociated into n layers supplied at different frequencies f1, f2, . . . , fn, wherein the receiving portion includes plural magnetic receivers supplied at different frequencies f1′, f2′, . . . , fn′ connected to one another in at least one column, each magnetic receiver being positioned under a layer, the indices n and m being integers >2, and wherein the processor makes it possible to know the magnetic field in each of the magnetic receivers of a column.
申请公布号 US9000781(B2) 申请公布日期 2015.04.07
申请号 US201013263385 申请日期 2010.04.08
申请人 Commissariat a l'Energie Atomique et aux Energies Alternatives 发明人 Decitre Jean-Marc
分类号 G01R27/26;G01N27/90;G01B7/30;G01B7/00;A61B5/107;G01L1/14 主分类号 G01R27/26
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A device for non-destructive testing of an electrically conductive part comprising: an induction portion; a receiving portion; and processing means; wherein the induction portion comprises an inductor dissociated into n elementary inductors of layer type supplied at different frequencies f1, f2, . . . , fn; wherein the receiving portion comprises n′ magnetic receivers distributed over m columns, each column comprising at most n receivers, the magnetic receivers being connected to one another over each column, the m columns of receivers being supplied by electrical signals v1′, v2′, . . . , vm′, of frequencies fi′, f2′, . . . , fm′, zero or non-zero, each magnetic receiver being arranged under an elementary inductor, m magnetic receivers being positioned under each elementary inductor, the indices n, n′ and m being positive integers such that n>=2, 1<n′<=n*m and m>1, wherein the processing means comprises, for each column of receivers of row i with 1≦i≦m, means of measuring the signal at terminals of this column of receivers followed by means of demodulating this signal at the frequencies f1+f′i, f2+f′i - - - fn+f′i or f1−f′i, f2−f′i - - - fn−f′i and means of calculating the magnetic field in each of the receivers of this column, and wherein the magnetic receivers are directed according to an axis of sensitivity, a main direction of currents of these elementary receivers being directed according to a perpendicular axis.
地址 Paris FR
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