| 发明名称 | Sorting method and apparatus | ||
| 摘要 | A method of and apparatus for sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at the at least two different wavelengths or ranges of wavelengths to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile. | ||
| 申请公布号 | US9000319(B2) | 申请公布日期 | 2015.04.07 |
| 申请号 | US200913141863 | 申请日期 | 2009.12.21 |
| 申请人 | Buhler Sortex Ltd | 发明人 | Deefholts Benedict |
| 分类号 | B07C5/00;B07C5/36;B07C5/342;G01N21/31;G01N21/85;G01N33/02;G01N21/359;G01N21/94 | 主分类号 | B07C5/00 |
| 代理机构 | Renner, Otto, Boisselle & Sklar, LLP | 代理人 | Renner, Otto, Boisselle & Sklar, LLP |
| 主权项 | 1. A method of sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at a first reflectance intensity from the identified object at a first wavelength in the range of from about 800 nm to about 1200 nm and a second reflectance intensity from the identified object at a second wavelength in the range of from about 1470 nm to about 1570 nm to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile. | ||
| 地址 | London GB | ||