发明名称 System and method for simulating measuring process of workpiece
摘要 In a method for simulating a measuring process of a workpiece, one or more virtual probes of a workpiece measuring machine are created. A vector of each of the virtual probes is calculated, and an appropriate vector for each of measuring points of a workpiece is acquired for a computerized drawing of the workpiece. The angle between the vector of each of the measuring points and the vector of each of the virtual probes is calculated. A virtual probe is determined for each measuring point according to the calculated angles. The measuring points are sorted according to the virtual probe of each measuring point, and the measuring programs of the sorted measuring points that relate to the same virtual probe are combined. The combined measuring programs are executed to determine whether the actual probe would collide with the workpiece.
申请公布号 US9002688(B2) 申请公布日期 2015.04.07
申请号 US201113316489 申请日期 2011.12.10
申请人 Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.;Hon Hai Precision Industry Co., Ltd. 发明人 Chang Chih-Kuang;Wu Xin-Yuan;Wang Min
分类号 G06F17/50;G01B21/04;G05B19/401 主分类号 G06F17/50
代理机构 Novak Druce Connolly Bove + Quigg LLP 代理人 Novak Druce Connolly Bove + Quigg LLP
主权项 1. A computerized method for simulating a measuring process of a workpiece using a computing device, the method being performed by execution of computer readable programs by at least one processor of the computing device, comprising: loading, by the at least one processor, a computerized drawing of the workpiece from a storage system of the computing device, and obtaining, by the at least one processor, coordinate information of measuring elements of the workpiece based on a work coordinate system; defining, by the at least one processor, motion parameters of an actual probe of a workpiece measuring machine, the motion parameters comprising a horizontal range of a first rotation angle of a supported end of the actual probe, a vertical range of a second rotation angle of a free end of the actual probe, and a step angle of the actual probe; creating, by the at least one processor, one or more virtual probes according to the motion parameters, wherein each of the one or more virtual probes comprises a first virtual rotation angle corresponding to the first rotation angle of the actual probe and a second virtual rotation angle corresponding to the second rotation angle of the actual probe; calculating, by the at least one processor, a vector of each of the one or more virtual probes according to the first virtual rotation angle and the second virtual rotation angle of each of the one or more virtual probes; acquiring, by the at least one processor, a vector of each measuring point of each of the measuring elements from the computerized drawing; calculating, by the at least one processor, an angle between each said vector of said each measuring point and each said vector of said each of the one or more virtual probes; determining, by the at least one processor, one of the one or more virtual probes for said each measuring point according to a minimum angle in the calculated angles; sorting, by the at least one processor, said each measuring point of each of the measuring elements into different categories according to the determined virtual probe for said each measuring point, wherein each of said categories of the sorted measuring points corresponds to a same virtual probe; combining, by the at least one processor, measuring programs of each of said categories of the sorted measuring points; executing, by the at least one processor, the combined measuring programs of each of said categories of the sorted measuring points to simulate the measuring process of the workpiece using said same virtual probes corresponding to each of said categories of the sorted measuring points, and determining, by the at least one processor, whether the actual probe of the workpiece measuring machine will collide with the workpiece; and recording, by the at least one processor, collision information of the actual probe of the workpiece measuring machine and the workpiece into the storage system if the actual probe of the workpiece measuring machine will collide with the workpiece.
地址 Shenzhen CN