| 发明名称 |
Auto-Blow Memory Repair |
| 摘要 |
In an example embodiment, a method may include collecting, at a controller within an integrated circuit, defect information indicative of defects identified during a built-in self-test (BIST) operation performed on plural memories embedded within the integrated circuit. Fuses within the integrated circuit may be blown based on the defect information collected automatically and without software intervention. The fuses blown may be used to inform a built-in self-repair (BISR) operation performed on the plural memories. |
| 申请公布号 |
US2015095732(A1) |
申请公布日期 |
2015.04.02 |
| 申请号 |
US201314039846 |
申请日期 |
2013.09.27 |
| 申请人 |
Cavium, Inc. |
发明人 |
Aiken Steven W.;Carlson David A. |
| 分类号 |
G01R31/317 |
主分类号 |
G01R31/317 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
collecting, at a controller within an integrated circuit, defect information indicative of defects identified during a built-in self-test (BIST) operation performed on plural memories embedded within the integrated circuit; blowing one or more fuses within the integrated circuit based on the defect information collected without software intervention; using one or more fuses blown to inform a built-in self-repair (BISR) operation performed on the plural memories. |
| 地址 |
San Jose CA US |
