发明名称 Internal line replaceable unit high intensity radiated field detector
摘要 Various embodiments for detecting a high Intensity radiated field (HIRF) in a line replaceable unit are provided. In an embodiment, the internal detector comprises a receiving means for receiving HIRF and generating an AC signal proportional to the HIRF, an RF filter configured to sample the AC signal to create a DC signal; and a detecting section configured to compare the DC signal with a threshold and output a result of the comparison to a built-in test section. The internal detector may be used to test EMI filter pin connectors of a closed line replaceable unit.
申请公布号 US8994391(B2) 申请公布日期 2015.03.31
申请号 US201213455777 申请日期 2012.04.25
申请人 BAE Systems Controls Inc. 发明人 Heiland, Jr. Paul Hart;Quinlivan Richard P.;Guth Thomas Edward;Horning Zain Adam;Watson Peter Joseph;Velazquez Gustavo Enrique Melendez
分类号 G01R31/3187;G01R29/08 主分类号 G01R31/3187
代理机构 Scully, Scott, Murphy & Presser, P.C. 代理人 Scully, Scott, Murphy & Presser, P.C.
主权项 1. A line replaceable unit (LRU) comprising; at least one circuit board, each of the at least one circuit board comprising circuit components mounted thereto and circuit traces; a chassis; a built-in test section; an external connector having an electromagnetic interference (EMI) filter; and an internal high intensity radiated field (HIRF) detector, the HIRF detector comprising: a circuit trace, the circuit trace being located on at least one of the at least one of the circuit boards, the circuit trace being configured and dimensioned to pick up an electromagnetic field having a frequency range of 100 MHz to 1 GHZ, the electromagnetic field inducing a current in the circuit trace proportional to a magnitude of the electromagnetic field; a circuit including an radiated field (RF) detector and filter configured to generate a DC signal based on the induced current in the circuit trace; and a processing section configured to compare the DC signal with a threshold and output a result of the comparison to the built-in test section.
地址 Endicott NY US