| 摘要 |
<p>PURPOSE: A test handler is provided to improve the reliability of a test by changing a diameter of a spraying unit of a duct according to an air spraying position to reduce a difference between a temperature of a semiconductor and a preset temperature. CONSTITUTION: A test handler(TH) includes a test tray(210), a test chamber(220), a match plate(230), and a temperature control device(240). The test tray loads a plurality of semiconductor devices. The test chamber tests the plurality of semiconductor devices at a required temperature and electrically connects the semiconductor devices to the tester by pushing the semiconductor devices. A temperature control device controls the temperatures of the semiconductor devices loaded on a test tray.</p> |
