| 发明名称 |
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND METHOD |
| 摘要 |
This disclosure relates generally to an electrical circuit and method. A capacitive element can be configured to be coupled in series with an electronic package component. A path resistance can be electrically coupled to the capacitive element. A driver can be configured to electrically charge the capacitive element. A voltage detector can be coupled to the capacitive element and configured to identify a condition of the electronic package component based on a measured voltage of the capacitive element. |
| 申请公布号 |
US2015084642(A1) |
申请公布日期 |
2015.03.26 |
| 申请号 |
US201314038284 |
申请日期 |
2013.09.26 |
| 申请人 |
Thiruvengadam Bharani;Kakizawa Akira |
发明人 |
Thiruvengadam Bharani;Kakizawa Akira |
| 分类号 |
G01R31/04;G01R31/28 |
主分类号 |
G01R31/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An electrical circuit, comprising:
a capacitive element configured to be coupled in series with an electronic package component; a path resistance electrically coupled to the capacitive element; a driver configured to electrically charge the capacitive element; and a voltage detector coupled to the capacitive element and configured to identify a condition of the electronic package component based on a measured voltage of the capacitive element. |
| 地址 |
Beaverton OR US |
