发明名称 Semiconductor Device
摘要 A semiconductor device has an active region defined by a device isolation region arranged on a surface of a semiconductor substrate, a plurality of transistor pillars arranged along a first direction within the active region, and a first dummy pillar disposed in the device isolation region. The first dummy pillar is arranged on a line extending along the first direction from the transistor pillars. The semiconductor device also has a second dummy pillar disposed between the transistor pillars and the first dummy pillar, a gate electrode continuously extending so as to surround each of side surfaces of the transistor pillars, a first power supply gate electrode surrounding a side surface of the first dummy pillar, and a second power supply gate electrode surrounding a side surface of the second dummy pillar. The second power supply gate electrode is connected to the gate electrode and the first power supply gate electrode.
申请公布号 US2015084122(A1) 申请公布日期 2015.03.26
申请号 US201414467474 申请日期 2014.08.25
申请人 Micron Technology, Inc. 发明人 TAKAISHI Yoshihiro
分类号 H01L29/10;H01L27/088;H01L29/78 主分类号 H01L29/10
代理机构 代理人
主权项 1. A semiconductor device comprising: an active region defined by a device isolation region arranged on a surface of a semiconductor substrate; a plurality of transistor pillars arranged along a first direction within the active region; a first dummy pillar disposed in the device isolation region, the first dummy pillar being arranged on a line extending along the first direction from the plurality of transistor pillars; a second dummy pillar disposed between the plurality of transistor pillars and the first dummy pillar; a gate electrode continuously extending so as to surround each of side surfaces of the plurality of transistor pillars; a first power supply gate electrode surrounding a side surface of the first dummy pillar; and a second power supply gate electrode surrounding a side surface of the second dummy pillar, the second power supply gate electrode being connected to the gate electrode and the first power supply gate electrode.
地址 Boise ID US