发明名称 Methods and Apparatus for ESD Structures
摘要 Methods and apparatus for ESD structures. A semiconductor device includes a first active area containing an ESD cell coupled to a first terminal and disposed in a well; a second active area in the semiconductor substrate, the second active area comprising a first diffusion of the first conductivity type for making a bulk contact to the well; and a third active area in the semiconductor substrate, separated from the first and second active areas by another isolation region, a portion of the third active area comprising an implant diffusion of the first conductivity type within a first diffusion of the second conductivity type and adjacent a boundary with the well of the first conductivity type; wherein the third active area comprises a diode coupled to the terminal and reverse biased with respect to the well of the first conductivity type.
申请公布号 US2015084154(A1) 申请公布日期 2015.03.26
申请号 US201414559047 申请日期 2014.12.03
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hsu Yu-Ying;Chang Tzu-Heng;Tseng Jen-Chou;Song Ming-Hsiang;Van Zwol Johannes;Smedes Taede
分类号 H01L27/02;H01L29/735;H01L29/66 主分类号 H01L27/02
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate of a first conductivity type; a first active area in the substrate containing an ESD cell coupled to a first terminal and disposed in a well of the first conductivity type; a second active area in the substrate, the second active area separated from the first active area by an one or more isolation regions, the second active area comprising a first highly-doped region of the first conductivity type; and a third active area in the substrate, the third active area separated from the first and second active areas by one or more isolation regions, the third active area comprising a reverse-biased diode, the reverse-biased diode comprising a first lightly-doped region of the first conductivity type and a second highly-doped region of a second conductivity type.
地址 Hsin-Chu TW